Precious Equipment
|
No. |
Equipment |
Person in Charge |
Tel Extention |
|---|---|---|---|
|
1 |
Field Emission Scanning Electron Microscope(FE-SEM) |
Chuan-Ming Tseng、Jyh-Wei Lee |
6320、6313 |
|
2 |
EDS |
Chuan-Ming Tseng、Jyh-Wei Lee |
6320、6313 |
|
3 |
Alpha-Step |
Li-Chun Chang |
6302 |
|
4 |
Fourier-transform infrared spectroscopy(FTIR) |
Yu-Ching Huang |
6317 |
|
5 |
UV/VIS/NIR spectrometers |
Yang-Yan Yu |
6305 |
| 6 |
SEM Pt deposition |
Chuan-Ming Tseng、Jyh-Wei Lee |
6320、6313 |
|
7 |
X-ray Photoelectron |
Chi-Hsien Huang, Yi Jin Wei |
6300、7513 |
|
8 |
Transmission Electron
|
Chuan-Ming Tseng、Yan-Ru Lin |
6320、6311 |
|
9 |
Field Emission Scanning Electron Microscope(FE-SEM) |
Jyh-Wei Lee |
6313 |
|
10 |
X-Ray Diffractometer(XRD) |
Pi-Chun Juan |
6306 |
|
11 |
Scanning Electron Microscope(SEM) |
Jyh-Shiarn Cherng |
6309 |
|
12 |
Nano-indenter *1 |
Jyh-Wei Lee |
6313 |
|
13 |
IV-CVmeasurement system |
Pi-Chun Juan |
6306 |
|
14 |
Atomic Force Microscopc(AFM) |
Li-Chun Chang |
6302、6335 |
|
15 |
Ellipsometer |
Jong-Hong Lu |
6303 |
|
16 |
Sputtering system(6 sets) |
Sheng-Chi Chen、Jyh-Shiarn Cherng、Pi-Chun Juan、Li-Chun Chang、Jong-Hong Lu、Yan-Ru Lin |
6307、6309、6306、6302、6303、6311 |
|
17 |
Surface profiler(Alpha-Step) |
Pak-Man Yiu |
6325 |
|
18 |
Electrochemical system(2 sets) |
Kun-Cheng Peng |
6310 |
|
19 |
Material processing simulation*1 |
Hsuan-Chung Wu |
6304 |